Langer – Positioning Systems

ICS 105 set

IC Scanner 4-Axis Positioning System

The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field’s direction.

Optionally the ICS 105 scanner can be used for measurements above small assemblies in combination with UH-DUT universal holder and SH 01 probe holder.

The IC scanner can be set up for ESD or EFT immunity tests on ICs in a few simple steps.

FLS 106 IC set

IC Scanner 4-Axis Positioning System

The FLS 106 IC scanner is a 4-axes positioning system that allows for the movement of ICR near-field probes along three linear axes and the rotation of the ICR near-field probes on one axis above an IC in its electronic assembly.

The ICR near-field probes allow for the measurement of high-frequency magnetic or E-fields up to 6 GHz with a high measuring resolution of 50 to 100 µm.

The IC scanner can be set up for surface scans and ESD or EFT immunity tests in a few simple steps.

FLS 106 IC set, IC Scanner 4-Axis Positioning System

FLS 106 PCB set

PCB Scanner, 3-Axis Positioning System

The FLS 106 PCB Langer scanner is a 3-axes positioning system used in conjunction with near-field probes in order to measure magnetic or E-fields up to 20 GHz and to pulse the device under test via H-field sources with pulse fields up to 200 mT.
The near-field probes or field sources can be moved along all three axes above the assembly.
A digital microscope camera allows for optical positioning control above the object being measured.
The included collision protection system stops the vertical movement of the probe if it touches the device under test.

The use of the scanner with near-field probes from the SX, RF, XF or LF family allows measurements in the frequency range from 100 kHz up to 20 GHz.
The FLS 106 PCB scanner is controlled by the ChipScan-Scanner software via a PC. The software simultaneously allows measured values reading from the spectrum analyzer, graphic representation (2D or 3D), the storage and output of measured data (CSV data file). The FLS 106 PCB scanner can be upgraded to a 4-axes positioning system via a rotary unit.

FLS 106 PCB set, PCB Scanner, 3-Axis Positioning System

LFS, Passive, 100 kHz up to 50 MHz

LFS-B 3

Scanner Probe 100 kHz up to 50 MHz

The measuring coil of the H-field probe LFS-B 3 sits orthogonally to the shaft. Using the probe tip perpendicularly ensures its correct placement directly on the assembly or device to be measured.
This allows for use at places on the surface of printed circuit boards typically hard to access, e.g. between large components of switching controllers.

The LFS-B 3 is a passive near-field probe for use in a scanner to measure magnetic field during development. The LFS-B 3 detects magnetic field lines emitted from the measured object at 90°. Magnetic field lines which enter the probe laterally are not detected. The near-field probe is small and handy. It has a current attenuating sheath and is, therefore, electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probe does not have an internal terminating resistance of 50 Ω.

LFS-B 3, Scanner Probe 100 kHz up to 50 MHz

RFS, Passive, 30 MHz up to 3 GHz

RFS set Scanner Probes 30 MHz up to 3 GHz The RFS set consist of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field.
RFS-R 50 Scanner Probe 30 MHz up to 3 GHz The RFS-R 50 H-field probe is designed for taking field measurements on assemblies, devices or cables at a distance of up to approx. 3 cm. The H-field probe can be used to identify larger components as sources of interference.
RFS-R 3-2 Scanner Probe 30 MHz up to 3 GHz The RFS-R 3-2 scanner probe is used for the high-resolution measurement of RF magnetic fields directly on an assembly e.g. in range around pins and IC cases, conducting paths, decoupling capacitor and EMC components.
RFS-R 0.3-3 Scanner Probe 30 MHz up to 3 GHz With its small probe head, the RFS-R 0.3-3 can measure magnetic fields in very high resolution. Thus even smallest components can be detected as interference sources. Furthermore, the small probe head is suitable for measurements at hard to reach spots, e.g. near IC pins.
RFS-B 3-2 Scanner Probe 30 MHz up to 3 GHz The measurement coil of the RFS-B 3-2 H-field scanner probe is arranged orthogonally to the probe shaft. This allows the probe head to be positioned very close to the assembly and to achieve a strong coupling. The RFS-B 3-2 detects magnetic field lines, which exit the measuring object othogonally. Magnetic field lines which enter the probe laterally are not detected. The RFS-B 3-2 is a passive near-field probe. Positioning the probe head vertically on the PC board sets the measuring coil directly onto the surface. This allows for measurements at hard-to-reach spots, e.g. between large components of on/off-controllers. The near-field probe has a sheath current attenuation and is electrically shielded. It can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. It does not have an internal terminating resistance.
RFS-B 0.3-3 Scanner Probe 30 MHz up to 3 GHz The scanner probe RFS-B 0.3-3 is designed for extreme small-scale detection of magnetic field. The coil inside the probe head is positioned at a 90° angle from the shaft. For measurements it can be positioned directly onto the measured object.
RFS-E 03 Scanner Probe 30 MHz up to 3 GHz Using the approx. 4×4 mm electrode, which is located in the bottom of the RFS-E 03 probe head, E-fields from clocked lines, IC pins, and smaller components can be detected.
RFS-E 10 Scanner Probe 30 MHz up to 3 GHz The electrode underneath the RF-E 10 scanner probe head has a width of approx. 0.2 mm, which can locate even the smallest E-field sources, e.g. conducting paths with a width of 0.1 mm or, single IC pins at high pin ICs.

XFS, Passive, 30 MHz up to 6 GHz

XFS-R 3-1 Scanner Probe 30 MHz up to 6 GHz The XFS-R 3-1 scanner probe is designed for direct high-resolution measurements of RF magnetic fields on an assembly, e.g. around the pins and IC cases, conducting paths, decoupling capacitor, and EMC components.
XFS-B 3-1 Scanner Probe 30 MHz up to 6 GHz The measuring coil of the XFS-B 3-1 magnetic field scanner probe is arranged orthogonally to the probe shaft. By positioning the probe head vertically, the measurement coil touches the surface of the printed circuit board directly. This allows for use at places on the surface of printed circuit boar…
XFS-E 10 Scanner Probe 30 MHz up to 6 GHz The electrode in the probe head of the XFS-E 10 scanner probe has a width of approx. 0.2 mm. With the probe even smallest E-field sources can be located, e.g. conducting paths with a width of 0.1 mm or single pins on multi pinned ICs. To measure, the E-field probe is positioned onto the object.
XFS-E 09s Scanner Probe 30 MHz up to 6 GHz The electrode on the probe head of the XFS-E 09s scanner probe detects electrical fields which, for example are decoupled above the IC’s surface. The probe’s resolution allows for measurements with a distance of 0.5 mm to 10 mm above an assembly. For measurement, the E-field probe is placed on the target.