Measuring systems and EMC tools for emission analysis of assemblies and devices at the development stage
|Measurement Technology for the Development Stage
The measurement technology for the development stage enables the detection of magnetic and electric field sources at your PCB directly at the workplace.
Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices. Technical parameters for the single probes are available from the respective product articles and from the overview PDF as a download.
To amplify the measurement signal and to protect your measurement receiver, we recommend the use of a preamplifier in the appropriate frequency range.
The near-field microprobes are designed for E-field and H-field measurements in a frequency range from 0.5 MHz to 6 GHz with a resolution from 60 µm to 300 µm.
|Optical Signal Transmission
Langer EMV-Technik GmbH`s optical signal transmission systems are used for the floating transmission of signals from the device under test up to a distance of 20 m.