Measuring systems and EMC tools for emission analysis of assemblies and devices at the development stage

Measurement Technology for the Development Stage
The measurement technology for the development stage enables the detection of magnetic and electric field sources at your PCB directly at the workplace.
Near-Field Probes
Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices. Technical parameters for the single probes are available from the respective product articles and from the overview PDF as a download.
To amplify the measurement signal and to protect your measurement receiver, we recommend the use of a preamplifier in the appropriate frequency range.
Near-Field Microprobes
The near-field microprobes are designed for E-field and H-field measurements in a frequency range from 0.5 MHz to 6 GHz with a resolution from 60 µm to 300 µm.
Optical Signal Transmission
Langer EMV-Technik GmbH`s optical signal transmission systems are used for the floating transmission of signals from the device under test up to a distance of 20 m.

Download “Overview all near-field probes Langer EMV-Technik GmbH