Langer – IC Test System

With the IC (integrated circuit) test system the developer tests the behavior of circuits during specific disturbances (conducted and radiated) or their emissions. The IC is tested in operation.

IC Test Environment With the IC Test Environment, you can determine EMC parameters of an IC and assess the EMC strength of ICs.
Emission The IC probes for emission allow for conducted RF measurements and measurements of RF field emission.
Immunity Measuring systems for the coupling of Burst, EFT, ESD and RF are available for conducted and radiated measurements of an IC`s immunity.
Simulation The simulation models of our probes help to understand and combine EMC measurement and simulation.