Measuring systems and EMC tools for accompanying immunity testing and analysis of assemblies and devices
Measuring systems and EMC tools for emission analysis of assemblies and devices at the development stage
|IC Test System
With the IC (integrated circuit) test system the developer tests the behavior of circuits during specific disturbances (conducted and radiated) or their emissions. The IC is tested in operation.
Positioning systems (scanner) for all Langer Near-Field Probes, Langer Injection Probes (ICI) and Near-Field Micro Probes (ICR).
Software for measurements during development
|Measuring and Calibration Stations
Measuring- and calibration stations are used to calibrate EMC measuring instruments and to determine EMC parameters of connectors.
|Equipment for Teaching and Training
Model assemblies for EMC experiments